Uploaded June 2021 | Updated September 2026, 1 week ago
For more information visit keysight.com/find/integrated-photonics
0:00 Introduction and Test solution overview
0:35 First pillar: instrumentation 1 - N7776C Tunable Lasers, N7786C Polarization Synthesizer, N7745C Multipower power meter
1:16 Test instrumentation 2 - M9615A PXIe Chassis, N5290A Performance head analyzer
2:13 Second pillar: Probing instrumentation – CM300XI Probe station
2:47 Electrical probing
3:10 Test setup
4:04 Third pillar: Pathway test automation – KS8400A Test sequencer
5:31 Edge coupling demo
7:14 https://keysight.com/find/integrated-...
Integrated photonic devices require comprehensive testing for optical and electro-optical parameters at the wafer or chip level.
Keysight’s integrated photonics test solution supports the workflow from chip design to test and analytics through easily configurable test scripts which include calibration and de-embedding of optical and RF paths between instruments and the DUT.
Optical tests are possible in the full 1260 to 1650 nm range through new C-series optical instruments. Electro-optical tests ranging from DC to 110 GHz are made with a N4372E lightwave component analyzer paired with M9601A and M9615A modular source measure units.
For more information visit keysight.com/find/integrated-photonics
0:00 Introduction and Test solution overview
0:35 First pillar: instrumentation 1 - N7776C Tunable Lasers, N7786C Polarization Synthesizer, N7745C Multipower power meter
1:16 Test instrumentation 2 - M9615A PXIe Chassis, N5290A Performance head analyzer
2:13 Second pillar: Probing instrumentation – CM300XI Probe station
2:47 Electrical probing
3:10 Test setup
4:04 Third pillar: Pathway test automation – KS8400A Test sequencer
5:31 Edge coupling demo
7:14 https://keysight.com/find/integrated-...
Integrated photonic devices require comprehensive testing for optical and electro-optical parameters at the wafer or chip level.
Keysight’s integrated photonics test solution supports the workflow from chip design to test and analytics through easily configurable test scripts which include calibration and de-embedding of optical and RF paths between instruments and the DUT.
Optical tests are possible in the full 1260 to 1650 nm range through new C-series optical instruments. Electro-optical tests ranging from DC to 110 GHz are made with a N4372E lightwave component analyzer paired with M9601A and M9615A modular source measure units.
