R&D 100 Entry: Power Spectrum Analysis @SandiaLabs
R&D 100 Entry: Power Spectrum Analysis  @SandiaLabs
Uploaded July 2020 | Updated September 2026, 3 weeks ago
Power Spectrum Analysis (PSA) is a Sandia-developed, non-intrusive, electrical technique that is used for counterfeit detection, defect localization, wear-out detection and a variety of other applications.

PSA captures distinct frequency-domain signatures of microelectronic devices using an innovative electrical stimulus scheme called off-normal biasing. Off-normal biasing is an unconventional way of powering microelectronic devices requiring minimal device electrical knowledge.

This non-destructive screening technique is more sensitive and can analyze parts faster and traditional methods like visual inspection, electrical testing and x-ray imaging. PSA readily differentiates parts from different manufacturers as well as differentiate between counterfeit and genuine parts.

2020-6729 O rev.
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R&D 100 Entry: Power Spectrum Analysis

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