Uploaded June 2026 | Updated September 2026, 2 weeks ago
Learn how MRAM and RRAM are changing the landscape for non-volatile memory in modern chip designs. In this video, we look at why the industry is moving beyond traditional technologies like NAND flash and eFuses, and how emerging memories such as MRAM are being adopted in advanced applications, including embedded cache use cases.
The video explains how MRAM and RRAM share architectural similarities with SRAM, allowing parts of existing DFT approaches to be retained, while still requiring additional test methods because of their different storage-cell physics. It also covers key requirements such as read/write trimming, RRAM forming, and weak cell screening.
You’ll also learn how Tessent MemoryBIST supports these advanced memory test needs and how ECC-aware technology helps address the inherent non-deterministic behavior of MRAM and RRAM. The result is a more effective approach to testing emerging non-volatile memories in production designs.
🔗 Learn more about Tessent here: https://sie.ag/wJKe3
▶️ Connect with us:
» LinkedIn: https://sie.ag/e8Bci
» EDA blogs: https://sie.ag/6WfyAb
» IC Design Community Discussion Board: https://sie.ag/5P8pF4
» X: https://sie.ag/3W7h4C
#EDA #Semiconductor #ElectronicsEngineering #DFT #SemiconductorTest
Learn how MRAM and RRAM are changing the landscape for non-volatile memory in modern chip designs. In this video, we look at why the industry is moving beyond traditional technologies like NAND flash and eFuses, and how emerging memories such as MRAM are being adopted in advanced applications, including embedded cache use cases.
The video explains how MRAM and RRAM share architectural similarities with SRAM, allowing parts of existing DFT approaches to be retained, while still requiring additional test methods because of their different storage-cell physics. It also covers key requirements such as read/write trimming, RRAM forming, and weak cell screening.
You’ll also learn how Tessent MemoryBIST supports these advanced memory test needs and how ECC-aware technology helps address the inherent non-deterministic behavior of MRAM and RRAM. The result is a more effective approach to testing emerging non-volatile memories in production designs.
🔗 Learn more about Tessent here: https://sie.ag/wJKe3
▶️ Connect with us:
» LinkedIn: https://sie.ag/e8Bci
» EDA blogs: https://sie.ag/6WfyAb
» IC Design Community Discussion Board: https://sie.ag/5P8pF4
» X: https://sie.ag/3W7h4C
#EDA #Semiconductor #ElectronicsEngineering #DFT #SemiconductorTest
