Uploaded June 2024 | Updated September 2026, 5 hours ago

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Join microscopy experts from ZMCC Bay Area as they answer your microscopy questions live.

Learn how to simplify TEM lamella preparation - see how a once challenging workflow is now straightforward

In this episode you will learn how to be able to:
- Monitor your sample live while thinning using SE2 and InLens detectors
- Use detectors simultaneously to enable milling uniformity and end at a target thickness

ℹ️ 𝗠𝗼𝗿𝗲 𝗶𝗻𝗳𝗼𝗿𝗺𝗮𝘁𝗶𝗼𝗻:
🔬 ZEISS FIB-SEM: zeiss.com/microscopy/en/products/sem-fib-sem/fib-sem/crossbeam.html
🔬 More about our microscopy solutions: zeiss.com/microscopy
🔬 ZMCC Bay Area: zeiss.com/microscopy/us/l/na-sites/zmcc-bay-area.html
🔬 ZEISS Portal: portal.zeiss.com

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