Uploaded June 2026 | Updated September 2026, 2 weeks ago
n this demonstration, we explore multi threaded DUT test plan execution using PathWave Test Executive for Manufacturing (PTEM).
The video walks through how to create a multi threaded test plan, configure execution modes, and run tests across multiple DUTs using a shared instrument. We demonstrate how PTEM supports sequential, batch (parallel), and asynchronous execution modes—allowing engineers to optimize test throughput without adding complex DUT coordination logic.
Using a Keysight 34465A benchtop digital multimeter, the demo shows how a single test plan can execute frequency measurements on multiple DUTs in parallel while sharing the same instrument resource.
This capability enables scalable multi DUT testing, improves test efficiency, and reduces the need for duplicate test sequences when expanding DUT count. Learn more: keysight.com/us/en/product/KS8328B/pathwave-test-executive-for-manufacturing-developer-version.html
n this demonstration, we explore multi threaded DUT test plan execution using PathWave Test Executive for Manufacturing (PTEM).
The video walks through how to create a multi threaded test plan, configure execution modes, and run tests across multiple DUTs using a shared instrument. We demonstrate how PTEM supports sequential, batch (parallel), and asynchronous execution modes—allowing engineers to optimize test throughput without adding complex DUT coordination logic.
Using a Keysight 34465A benchtop digital multimeter, the demo shows how a single test plan can execute frequency measurements on multiple DUTs in parallel while sharing the same instrument resource.
This capability enables scalable multi DUT testing, improves test efficiency, and reduces the need for duplicate test sequences when expanding DUT count. Learn more: keysight.com/us/en/product/KS8328B/pathwave-test-executive-for-manufacturing-developer-version.html
