Uploaded August 2023 | Updated September 2026, 2 weeks ago
This demonstration uses a dual-channel Model 2602B SMU to perform a DC current gain (hFE) test on a bipolar junction transistor (BJT) using the instrument front panel.
Learn more about the featured products.
2600B Series SMU:
tek.com/en/products/keithley/source-measure-units/2600b-series-sourcemeter
This demonstration uses a dual-channel Model 2602B SMU to perform a DC current gain (hFE) test on a bipolar junction transistor (BJT) using the instrument front panel.
Learn more about the featured products.
2600B Series SMU:
tek.com/en/products/keithley/source-measure-units/2600b-series-sourcemeter










