B2900C/CL: SMU Capable of Measuring Very Low Signals @KeysightHandsOn
B2900C/CL: SMU Capable of Measuring Very Low Signals  @KeysightHandsOn
Uploaded November 2025 | Updated September 2026, 2 weeks ago
Effortlessly achieve precise IV measurements of semiconductors with the Keysight B2900C/CL Precision Source Measure Units (SMUs ).

Developing modern semiconductors requires highly accurate measurement of extremely low currents and voltages, often down to the femtoampere range. Conventional benchtop SMUs often lack the resolution necessary for precise device characterization, forcing engineers to rely on expensive analyzers.

The Keysight B2900C/CL Precision SMUs address this challenge by offering ultra-high resolution (10 fA, 100 nV), revealing your device’s true characteristics without the high cost. Plus, the built-in graphical display lets you check test results without a PC, saving time and steps.

Discover how the B2900C/CL transforms semiconductor development:
keysight.com/us/en/products/source-measure-units-smu/b2900-series-precision-source-measure-units-smu.html

View the datasheet:
keysight.com/us/en/assets/3125-1016/data-sheets/B2900C-B2900CL-Series-Precision-SourceMeasure-Unit.pdf

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B2900C/CL: SMU Capable of Measuring Very Low Signals

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