Uploaded December 2025 | Updated September 2026, 2 weeks ago
Reveal the IV characteristics and transient response of your device with Keysight B2900C/CL Precision Source Measure Units (SMUs).
In photodetector development, accurately evaluating both IV curves and transient responses is essential. Conventional benchtop SMUs that can measure nA-level currents often struggle to accurately capture transient responses due to slow sampling speed. As a result, even for a single device evaluation, engineers needed a precision SMU and an additional instrument capable of high-speed sampling.
The Keysight B2900C/CL Precision SMUs address this challenge by offering ultra-high resolution (down to 10 fA, 100 nV) and a fast sampling interval of 10 μs. This allows engineers to accurately capture fast transient responses, such as the rise of the waveform and light-induced current spikes, as well as tiny currents. Additionally, the built-in graphical display lets you check the waveform on the SMU without needing a PC, making your test more efficient.
Discover how the B2900C/CL transforms photodetector development:
keysight.com/us/en/products/source-measure-units-smu/b2900-series-precision-source-measure-units-smu.html
View the datasheet:
keysight.com/us/en/assets/3125-1016/data-sheets/B2900C-B2900CL-Series-Precision-SourceMeasure-Unit.pdf
#SourceMeasureUnit #SourceMeter #SMUs #PrecisionMeasurement #IVMeasurement #IV #CurrentMeasurement #VoltageMeasurement #HighSourcing #HighAccuracy #HighResolution #Semiconductor #SemiconductorDevice #Material #HigherPerformance #keysight #keysighttechnologies #engineering #electronicengineering
Reveal the IV characteristics and transient response of your device with Keysight B2900C/CL Precision Source Measure Units (SMUs).
In photodetector development, accurately evaluating both IV curves and transient responses is essential. Conventional benchtop SMUs that can measure nA-level currents often struggle to accurately capture transient responses due to slow sampling speed. As a result, even for a single device evaluation, engineers needed a precision SMU and an additional instrument capable of high-speed sampling.
The Keysight B2900C/CL Precision SMUs address this challenge by offering ultra-high resolution (down to 10 fA, 100 nV) and a fast sampling interval of 10 μs. This allows engineers to accurately capture fast transient responses, such as the rise of the waveform and light-induced current spikes, as well as tiny currents. Additionally, the built-in graphical display lets you check the waveform on the SMU without needing a PC, making your test more efficient.
Discover how the B2900C/CL transforms photodetector development:
keysight.com/us/en/products/source-measure-units-smu/b2900-series-precision-source-measure-units-smu.html
View the datasheet:
keysight.com/us/en/assets/3125-1016/data-sheets/B2900C-B2900CL-Series-Precision-SourceMeasure-Unit.pdf
#SourceMeasureUnit #SourceMeter #SMUs #PrecisionMeasurement #IVMeasurement #IV #CurrentMeasurement #VoltageMeasurement #HighSourcing #HighAccuracy #HighResolution #Semiconductor #SemiconductorDevice #Material #HigherPerformance #keysight #keysighttechnologies #engineering #electronicengineering
