ZEISS Crossbeam - How to prepare a TEM sample with laser assistance @ZEISSMicroscopy
ZEISS Crossbeam - How to prepare a TEM sample with laser assistance  @ZEISSMicroscopy
Uploaded January 2021 | Updated September 2026, 2 hours ago
Watch this video and learn how to prepare a TEM sample from a deeply buried region of interest (ROI). As a first step, a macro-lamella containing the ROI is prepared by a femtosecond laser (fs-laser). Then, the top of the macro-lamella is removed by FIB milling, so that the ROI can be accessed by FIB. After that, the sample can be prepared easily and lifted out for final FIB thinning.Flip the grid a second time, from horizontal to upright position.

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ZEISS Crossbeam - How to prepare a TEM sample with laser assistance

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