Uploaded December 2020 | Updated September 2026, 2 days ago

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Watch this video and learn how to prepare TEM samples with ZEISS Crossbeam, your FIB-SEM for high throughput 3D analysis and sample preparation:

- locate and protect the region of interest (ROI)
- perform cutout and liftout
- attach the sample to a grid lying horizontally, then flip the grid from horizontal to upright position.

ℹ️ 𝗠𝗼𝗿𝗲 𝗶𝗻𝗳𝗼𝗿𝗺𝗮𝘁𝗶𝗼𝗻:
🔬 Learn more about ZEISS Crossbeam: zeiss.com/crossbeam
🔬 More about our microscopy solutions: zeiss.com/microscopy

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