Uploaded June 2026 | Updated September 2026, 2 weeks ago
As device complexity increases and heterogeneous integration becomes more common, traditional test approaches are no longer enough on their own. This video explores how system-level test (SLT) is evolving beyond functional test to include structural test, and why in-field deterministic test is becoming increasingly important for advanced silicon.
The video explains how newer defect models drive higher pattern volumes and rising manufacturing test costs, creating interest in applying structural tests during SLT using functional interfaces. It also examines the growing role of in-field test in hyperscale data centers, automotive systems, and other electronics where monitoring device health during operation is becoming essential.
You’ll also hear why logic BIST and random-pattern approaches may not achieve the required quality levels for advanced nodes, and why deterministic in-field test introduces new challenges around pattern memory, storage location, and test scheduling.
▶️ Topics covered include:
-The shift from functional-only SLT toward structural testing
-Why advanced defect models are changing test economics
-Applying structural test through functional interfaces
-In-field test for operational reliability and silent data corruption risk
-The limits of traditional logic BIST for advanced devices
-Memory and scheduling tradeoffs in deterministic in-field test
-Silicon lifecycle monitoring through key-on, key-off, periodic, and opportunistic testing
This video is a useful overview of how the industry is rethinking test strategy to improve quality, reliability, and lifecycle visibility for modern ICs.
Want to explore further? See how Tessent Silicon Lifecycle Solutions can help address these challenges: https://sie.ag/BqG36
▶️ Connect with us:
» LinkedIn: https://sie.ag/6ehk63
» EDA blogs: https://sie.ag/3Zwa6b
» IC Design Community Discussion Board: https://sie.ag/2Hynmo
#EDA #Semiconductor #ElectronicsEngineering #SLT
As device complexity increases and heterogeneous integration becomes more common, traditional test approaches are no longer enough on their own. This video explores how system-level test (SLT) is evolving beyond functional test to include structural test, and why in-field deterministic test is becoming increasingly important for advanced silicon.
The video explains how newer defect models drive higher pattern volumes and rising manufacturing test costs, creating interest in applying structural tests during SLT using functional interfaces. It also examines the growing role of in-field test in hyperscale data centers, automotive systems, and other electronics where monitoring device health during operation is becoming essential.
You’ll also hear why logic BIST and random-pattern approaches may not achieve the required quality levels for advanced nodes, and why deterministic in-field test introduces new challenges around pattern memory, storage location, and test scheduling.
▶️ Topics covered include:
-The shift from functional-only SLT toward structural testing
-Why advanced defect models are changing test economics
-Applying structural test through functional interfaces
-In-field test for operational reliability and silent data corruption risk
-The limits of traditional logic BIST for advanced devices
-Memory and scheduling tradeoffs in deterministic in-field test
-Silicon lifecycle monitoring through key-on, key-off, periodic, and opportunistic testing
This video is a useful overview of how the industry is rethinking test strategy to improve quality, reliability, and lifecycle visibility for modern ICs.
Want to explore further? See how Tessent Silicon Lifecycle Solutions can help address these challenges: https://sie.ag/BqG36
▶️ Connect with us:
» LinkedIn: https://sie.ag/6ehk63
» EDA blogs: https://sie.ag/3Zwa6b
» IC Design Community Discussion Board: https://sie.ag/2Hynmo
#EDA #Semiconductor #ElectronicsEngineering #SLT
