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NI Apps | Power Semiconductor Rollercoaster: HTGB and H3TRB @NIApps | Uploaded 4 weeks ago | Updated 23 hours ago
In this episode, Gabriel Lieser, Head of Power Semiconductor Research at NI, explains HTGB (High-Temperature Gate Bias) and H3TRB (High Humidity High-Temperature Reverse Bias) tests. He covers important considerations for conducting these tests, particularly for wide bandgap components, and highlights their significance for various applications in the final product.

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Power Semiconductor Rollercoaster: HTGB and H3TRB @NIApps