Uploaded August 2024 | Updated September 2026, 2 weeks ago
The Keysight Electrical Structural Tester (EST) leverages cutting-edge nano Vectorless Test Enhanced Performance (nVTEP) technology to provide unparalleled defect detection capabilities. By creating a capacitive structure between the wire bond and a sensor plate, the EST can identify subtle defects such as wire sag, near shorts, and stray wires, ensuring comprehensive assessment of wire bond integrity.
Optimized for production efficiency, the Keysight EST supports up to 20 parallel test sites, making it ideal for integration into production-level testing processes and field return evaluations. This high level of parallelism enables the Keysight EST to achieve a Units Per Hour (UPH) rate of 72,000 ICs, significantly enhancing throughput in electronic package testing.
Learn more:
keysight.com/us/en/products/application-specific-test-systems/electrical-structural-tester.html
Deep dive into the working principles and case studies of the Keysight EST:
1. keysight.com/blogs/en/tech/2022/08/16/detect-different-wire-bond-deformation-defects-with-vtep
2. keysight.com/blogs/en/tech/2022/06/01/detecting-near-short-defects-in-ic-wire-bonds-with-vtep-technology
3. keysight.com/blogs/en/tech/2022/06/21/ic-wire-bond-deformation-detection
#semiconductor #wirebond #wirebonddefects #nearshortwire #straywire #wiresag #nanovtep #microelectronics #automotive #safety #failureanalysis #manufacturing #medical #aerospace #defense
The Keysight Electrical Structural Tester (EST) leverages cutting-edge nano Vectorless Test Enhanced Performance (nVTEP) technology to provide unparalleled defect detection capabilities. By creating a capacitive structure between the wire bond and a sensor plate, the EST can identify subtle defects such as wire sag, near shorts, and stray wires, ensuring comprehensive assessment of wire bond integrity.
Optimized for production efficiency, the Keysight EST supports up to 20 parallel test sites, making it ideal for integration into production-level testing processes and field return evaluations. This high level of parallelism enables the Keysight EST to achieve a Units Per Hour (UPH) rate of 72,000 ICs, significantly enhancing throughput in electronic package testing.
Learn more:
keysight.com/us/en/products/application-specific-test-systems/electrical-structural-tester.html
Deep dive into the working principles and case studies of the Keysight EST:
1. keysight.com/blogs/en/tech/2022/08/16/detect-different-wire-bond-deformation-defects-with-vtep
2. keysight.com/blogs/en/tech/2022/06/01/detecting-near-short-defects-in-ic-wire-bonds-with-vtep-technology
3. keysight.com/blogs/en/tech/2022/06/21/ic-wire-bond-deformation-detection
#semiconductor #wirebond #wirebonddefects #nearshortwire #straywire #wiresag #nanovtep #microelectronics #automotive #safety #failureanalysis #manufacturing #medical #aerospace #defense
