Characterize Deeply Buried Defects: XRM to Laser-FIB-SEM | ZMCC Live Demo | Episode 26 @ZEISSMicroscopy
Characterize Deeply Buried Defects: XRM to Laser-FIB-SEM | ZMCC Live Demo | Episode 26  @ZEISSMicroscopy
Uploaded December 2024 | Updated September 2026, 2 days ago
Join microscopy experts from ZMCC Bay Area as they answer your microscopy questions live.

In this episode you will learn:
- How to leverage the non-destructive, 3D nature of Versa XRM data to identify and zero-in on a deeply buried defect
- How to access those deeply buried defects quickly and effectively with an integrated fs-laser on the Crossbeam and Atlas 5
- How to characterize the buried defect once accessed with imaging and compositional analyses

โ„น๏ธ ๐— ๐—ผ๐—ฟ๐—ฒ ๐—ถ๐—ป๐—ณ๐—ผ๐—ฟ๐—บ๐—ฎ๐˜๐—ถ๐—ผ๐—ป:
๐Ÿ”ฌ ZEISS Atlas 5: zeiss.com/microscopy/us/products/software/zeiss-atlas-5.html
๐Ÿ”ฌ ZEISS Versa XRMs: zeiss.com/microscopy/us/products/x-ray-microscopy/versaxrm.html
๐Ÿ”ฌ ZEISS Crossbeam Family: zeiss.com/microscopy/us/products/sem-fib-sem/fib-sem/crossbeam.html
๐Ÿ”ฌ ZMCC Bay Area: zeiss.com/microscopy/us/l/na-sites/zmcc-bay-area.html
๐Ÿ”ฌ ZEISS Portal: portal.zeiss.com
๐Ÿ”ฌ More about our microscopy solutions: zeiss.com/microscopy

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Characterize Deeply Buried Defects: XRM to Laser-FIB-SEM | ZMCC Live Demo | Episode 26

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