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MIT OpenCourseWare | 7. Oxidation and the Si/SiO2 Interface. 2D Effects, Doping Effects, Point Defect @mitocw | Uploaded June 2024 | Updated October 2024, 6 hours ago.
MIT 6.774 Physics of Microfabrication: Front End Processing, Fall 2004
Instructor: Judy Hoyt

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7. Oxidation and the Si/SiO2 Interface. 2D Effects, Doping Effects, Point DefectLecture 29: EMI Filters, Part 2Lecture 23: Building Binary Phase Diagrams, Part ILecture 16: Line BroadeningLecture 24: AdvertisingLecture 11: The IS-LM-PC ModelLecture 19: Nuclear Diagnostics11.350 Lecture 8: Climate Risk and Real Estate MarketsRobust Science with Prof. Rebecca SaxeLecture 18: Strategic Investment, Part 114. Transient Enhanced Diffusion (TED) - +1 Model, (311) Defects and TED IntroductionMaking Challenge Tutorial Video: Plaster Mixing

7. Oxidation and the Si/SiO2 Interface. 2D Effects, Doping Effects, Point Defect @mitocw

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